Fiber Optic Fourier Transform Infrared Spectroscopic Techniques for Advanced On‐Line Chemical Analysis in Semiconductor Fabrication Tools
作者:
Michael Kester,
Marc Trygstad,
Paul Chabot,
期刊:
AIP Conference Proceedings
(AIP Available online 1903)
卷期:
Volume 683,
issue 1
页码: 764-768
ISSN:0094-243X
年代: 1903
DOI:10.1063/1.1622557
出版商: AIP
数据来源: AIP
摘要:
A unique analytical methodology has recently been developed to perform real‐time, on‐line chemical analysis of bath solutions in semiconductor fabrication tools. A novel, patented fiber optic sensor is used to transmit infrared light directly through the tube walls of the circulating bath solutions within the fabrication tool in a completely non‐invasive, non‐extractive way. The sensor simply “clips” onto the tubing, thus permitting immediate analysis of the bath composition by Fourier Transform infrared (FTIR) spectroscopy. The infrared spectrometer is capable of multiplexing up to eight “Clippir™” sensor heads to a single interferometer using fiber optic cables. The instrument can analyze almost any bath solution utilized today. The analysis is performed using the near‐infrared (NIR) portion of the electromagnetic spectrum, where absorption bands related to molecular vibrations can be found. The Fourier Transform infrared spectrometer gives access to absorption bands over a wide range of frequencies (or wavelengths), and the absorptions are correlated to concentrations using a chemometric approach employing a partial least‐squares algorithm. Models are generated from this approach for each chemistry to be analyzed. This paper will review the analytical technology necessary to make such measurements, and discuss the instrument performance criteria required to achieve accurate and precise measurements of bath chemistries. The ability to measure non‐infrared absorbing compounds will be discussed, as will the nature of the influence of sample temperature on measurement. Issues critical to the development of robust models and their direct implementation on multiple channels and even different instruments will be considered. © 2003 American Institute of Physics
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