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Magnetic imaging by ‘‘force microscopy’’ with 1000 A˚ resolution

 

作者: Y. Martin,   H. K. Wickramasinghe,  

 

期刊: Applied Physics Letters  （AIP Available online 1987）
卷期: Volume 50, issue 20  

页码: 1455-1457

 

ISSN:0003-6951

 

年代: 1987

 

DOI:10.1063/1.97800

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We describe a new method for imaging magnetic fields with 1000 A˚ resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high‐resolution mapping of both static and dynamic magnetic fields.

 

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