Nonuniqueness of time-dependent-dielectric-breakdown distributions
作者:
J. C. Jackson,
T. Robinson,
O. Oralkan,
D. J. Dumin,
G. A. Brown,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 25
页码: 3682-3684
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120480
出版商: AIP
数据来源: AIP
摘要:
The time-dependent-dielectric-breakdown (TDDB) distributions measured on a series of identical oxides at the same voltages have been shown to depend on the resistance and capacitance of the measurement test equipment. The TDDB distributions were shifted to shorter times if the impedance of the test equipment was lowered and/or the capacitance of the test equipment was raised. The lower resistances and higher capacitances allowed the nonshorting early electric breakdowns to develop into shorting, thermal, dielectric breakdowns. ©1997 American Institute of Physics.
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