首页   按字顺浏览 期刊浏览 卷期浏览 Atomic‐resolution studies of surface dynamics by electron microscopy
Atomic‐resolution studies of surface dynamics by electron microscopy

 

作者: David J. Smith,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena  （AIP Available online 1985）
卷期: Volume 3, issue 5  

页码: 1563-1567

 

ISSN:0734-211X

 

年代: 1985

 

DOI:10.1116/1.582985

 

出版商: American Vacuum Society

 

关键词: SURFACE ANALYSIS;ELECTRON MICROSCOPY;SURFACES;SURFACE STRUCTURE;REVIEWS;DYNAMICS;HIGH−RESOLUTION METHODS;METALS;SEMICONDUCTOR MATERIALS;OXIDES;IMAGES;ELECTRON MICROSCOPES;CdTe;Au;ZnCrFeO4

 

数据来源: AIP

 

摘要:

High resolution electron microscopy (HREM) has been applied to the characterization of surfaces and surface rearrangements using the profile imaging method. This review paper outlines the basic principles of the technique and then surveys the recent atomic‐level observations of metal, semiconductor, and oxide particle surfaces. Advantages and possible drawbacks of the technique are briefly discussed.

 

点击下载:  PDF (757KB)



返 回