The use of a hybrid diffraction unit in the measurement of dislocation densities by electron microscopy
作者:
R. C. Ecob,
期刊:
Journal of Microscopy
(WILEY Available online 1985)
卷期:
Volume 137,
issue 1
页码: 3-8
ISSN:0022-2720
年代: 1985
DOI:10.1111/j.1365-2818.1985.tb02554.x
出版商: Blackwell Publishing Ltd
关键词: TEM;dislocation density;hollow cone illumination;foil thickness
数据来源: WILEY
摘要:
SUMMARYThe expression used in the electron microscopical measurement of dislocation densities is ϱ=2N/Lt, whereNis the number of intersections between the dislocation lines in a TEM image,Lthe total length of a set of sampling lines superimposed upon that image (corrected for magnification) andtthe thickness of the thin foil containing the dislocation structure. During the estimation of ϱ it is therefore important to reduce errors in the measurements of all three variables. It is shown how calibration of the microscope magnification, careful consideration of diffraction conditions and use of the hollow cone and rocking beam facilities on the hybrid diffraction unit fitted to the Philips EM 400T can assist in increasing the speed and accuracy of the measurement procedur
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