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Vernier fringe‐counting device for laser wavelength measurements

 

作者: A. Kahane,   M. S. O’Sullivan,   N. M. Sanford,   B. P. Stoicheff,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1983）
卷期: Volume 54, issue 9  

页码: 1138-1142

 

ISSN:0034-6748

 

年代: 1983

 

DOI:10.1063/1.1137537

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A vernier fringe‐counting circuit designed for use with a Kowalski‐type wavemeter is described. Wavelength measurements made with this device have a high reproducibility of 5×10−9(or 1/50 of a fringe) and measured accuracy of 4×10−9. The results of accuracy tests are presented along with systematic errors incurred when the wavelengths of two He–Ne lasers (632.9 nm) are compared by the vernier method.

 

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