首页   按字顺浏览 期刊浏览 卷期浏览 An X‐Ray Study of Thermally Induced Stresses in Microconstituents of Aluminum&hy...
An X‐Ray Study of Thermally Induced Stresses in Microconstituents of Aluminum‐Silicon Alloys

 

作者: John P. Nielsen,   Walter R. Hibbard,  

 

期刊: Journal of Applied Physics  （AIP Available online 1950）
卷期: Volume 21, issue 9  

页码: 853-854

 

ISSN:0021-8979

 

年代: 1950

 

DOI:10.1063/1.1699773

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The changing width of high angle Debye x‐ray diffraction lines from eutectiferous aluminum‐silicon alloys during thermal cycling as measured by a recording Geiger counter spectrometer is interpreted in terms of stresses resulting from the differences in thermal expansion of the microconstituents.

 

点击下载:  PDF (161KB)



返 回