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Comment on ‘‘High intensity low tube‐voltage x‐ray source for laboratory extended x‐ray absorbed fine structure measurements’’ [Rev. Sci. Instrum.64, 2702 (1993)]

 

作者: Kenji Sakurai,   Hitoshi Sakurai,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1994)
卷期: Volume 65, issue 7  

页码: 2417-2418

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1144701

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In the cited article, an x‐ray source developed for extended x‐ray absorption fine structure measurements is described. After the publication, the authors have further improved the performance by employing a compact rotating anode and by optimizing an electron gun. This new x‐ray generator provides high tube current of 1100 mA at 18 kV with the narrow focal spot of about 0.1 mm in width. Extremely intense monochromatic x rays, which are completely free from higher order reflections, are now available in a laboratory, and the measurement time required for a practical sample has been shortened to less than 2 h.

 

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