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Geometry dependence of thin‐film transverse thermoelectric voltages

 

作者: R. J. von Gutfeld,  

 

期刊: Journal of Applied Physics  (AIP Available online 1976)
卷期: Volume 47, issue 8  

页码: 3436-3437

 

ISSN:0021-8979

 

年代: 1976

 

DOI:10.1063/1.323180

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have measured the transverse voltage from slant‐angle‐deposited metal films due to laser illumination as a function of film geometry. For a fixed laser spot size, the voltage is found to vary inversely with film widthdfordsmall compared to contact separationa. Ford/a⩾∼1 the voltage approaches a constant. The experimental results are in good agreement with the open‐circuit voltage from a finite‐current dipole and consistent with the thermoelectric model previously proposed. Useful design parameters for transverse thermoelectric optical detectors are implied by the data.

 

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