首页   按字顺浏览 期刊浏览 卷期浏览 Sample Preparation for Transmission Electron Microscopy of Germanium
Sample Preparation for Transmission Electron Microscopy of Germanium

 

作者: R. P. Riesz,   C. G. Bjorling,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1961）
卷期: Volume 32, issue 8  

页码: 889-891

 

ISSN:0034-6748

 

年代: 1961

 

DOI:10.1063/1.1717551

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Bulk samples of germanium have been reduced to sections thin enough for transmission electron microscopy. The apparatus and techniques of this virtual‐electrode electrolytic etching process are described in detail with emphasis on the geometric control obtained. An example is given of an electron transmission micrograph of a 500‐A‐thick section.

 

点击下载:  PDF (288KB)



返 回