Hole trap levels in Mg-doped GaN grown by metalorganic vapor phase epitaxy
作者:
H. Nagai,
Q. S. Zhu,
Y. Kawaguchi,
K. Hiramatsu,
N. Sawaki,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 73,
issue 14
页码: 2024-2026
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.122356
出版商: AIP
数据来源: AIP
摘要:
Hole trap levels in a Mg-doped GaN grown by metalorganic vapor phase epitaxy (MOVPE) are studied with deep level transient spectroscopy (DLTS). The Mg concentration of the sample was4.8×1019 cm−3,but the hole concentration was as low as1.3×1017 cm−3at room temperature. The DLTS spectrum has a dominant peakD1with activation energy of0.41±0.05 eV,accompanied by two additional peaks with activation energies of0.49±0.09 eV(D2)and0.59±0.05 eV(D3).It was found that the dominant peakD1consists of five peaks, each of which has different activation energy and capture cross section. A relevant model for these levels is presented in relation to the Mg–N–H complexes. ©1998 American Institute of Physics.
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