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Electrical and xerographic properties of biaxially stretched poly( p‐phenylene sulfide) films annealed in oxygen

 

作者: Eiichiro Tanaka,   Akio Takimoto,   Masanori Watanabe,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 67, issue 2  

页码: 842-847

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.345740

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Biaxially stretched poly (p‐phenylene sulfide) (PPS) film showed high photosensitivity after being annealed in oxygen for 6 h at a temperature between 270 and 285 °C. The spectral dependence of xerographic photosensitivity of the film had a peak at around 365 nm, and xerographic gain under 365‐nm UV irradiation was 0.1 or above. The micro‐Vickers hardness of PPS reached 60 kg/mm2after annealing at 280 °C for 6 h. The spectral photosensitivity was greatly improved by depositing a thin amorphous selenium‐tellurium alloy on the annealed PPS film. The half‐decay exposure of the annealed PPS with Se‐Te alloy film was 2.3 lx s under white illumination. These experimental results demonstrate that the annealing of PPS film under an oxygen environment gives this film excellent photosensitivity and mechanical durability and hence, renders this material attractive for a xerographic application.

 

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