Two novel types of x‐ray monochromators which eliminate unwanted higher orders usually present in crystal monochromatized synchrotron radiation beams have been used successfully in spectroscopic studies. The design of the monochromators is based on the refractive index correction’s dependence on wavelength and relative orientation of crystal surface to reflecting Bragg planes. In addition to the order sorting property, both types of monochromators can be used to decrease or increase the reflected beam cross section by Bragg focusing, and in one type, to determine the polarization state of the diffracted beam.