Electronic origin of the stability trend inTiSi2phases with Al or Mo layers
作者:
F. Bo`noli,
M. Iannuzzi,
Leo Miglio,
V. Meregalli,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 73,
issue 14
页码: 1964-1966
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.122336
出版商: AIP
数据来源: AIP
摘要:
Through a tight-binding rigid-band approach we show that changes in the relative stability of theC54,C49,andC40phases ofTiSi2,with electrons per atom ratio, are produced by the corresponding differences in the electronic density of states at the Fermi level. In particular, by increasing this ratio the stable phase evolves fromC49toC54,and then toC40.Our microscopic model provides a straightforward interpretation of very recent experimental findings concerning the sizeable variations in the transition temperature betweenC49andC54TiSi2in the presence of Al or Mo layers. ©1998 American Institute of Physics.
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