首页   按字顺浏览 期刊浏览 卷期浏览 Electronic origin of the stability trend inTiSi2phases with Al or Mo layers
Electronic origin of the stability trend inTiSi2phases with Al or Mo layers

 

作者: F. Bo`noli,   M. Iannuzzi,   Leo Miglio,   V. Meregalli,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 73, issue 14  

页码: 1964-1966

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.122336

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Through a tight-binding rigid-band approach we show that changes in the relative stability of theC54,C49,andC40phases ofTiSi2,with electrons per atom ratio, are produced by the corresponding differences in the electronic density of states at the Fermi level. In particular, by increasing this ratio the stable phase evolves fromC49toC54,and then toC40.Our microscopic model provides a straightforward interpretation of very recent experimental findings concerning the sizeable variations in the transition temperature betweenC49andC54TiSi2in the presence of Al or Mo layers. ©1998 American Institute of Physics.

 

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