首页   按字顺浏览 期刊浏览 卷期浏览 In situdetermination of the surface roughness of diamond films using optical pyrometry
In situdetermination of the surface roughness of diamond films using optical pyrometry

 

作者: Z. L. Akkerman,   Y. Song,   Z. Yin,   F. W. Smith,   Roy Gat,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 8  

页码: 903-905

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.120931

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The initial growth of diamond films in a microwave plasma reactor has been studied usingin situtwo-color infrared pyrometry. Analysis of the observed oscillations of the apparent temperature has yielded the substrate temperature and also the instantaneous film growth rate and rms surface roughness &sgr;. Two distinct regimes of growth have been clearly identified: an initial period of rapidly increasing &sgr; before the diamond nuclei coalesce, followed by a slower increase of &sgr; with thickness as the continuous film grows further. The differing initial roughnesses and emissivities of Si and Mo substrates have been shown to have important effects on the growth of diamond. ©1998 American Institute of Physics. 

 

点击下载:  PDF (75KB)



返 回