Interpretation and Generalization of Youden's Two-Sample Diagram
作者:
MandelJohn,
LashofTheodore W.,
期刊:
Journal of Quality Technology
(Taylor Available online 1974)
卷期:
Volume 6,
issue 1
页码: 22-36
ISSN:0022-4065
年代: 1974
DOI:10.1080/00224065.1974.11980612
出版商: Taylor&Francis
关键词: Youden's Two-Sample Diagram;Fitting an Ellipse;Random and Systematic Errors;Additivity;Non-Additivity;Interlaboratory Comparisons;Sphericity Test
数据来源: Taylor
摘要:
Youden's two sample diagram is a useful method for certain types of interlaboratory comparisons of test results. Generally, points in the plot fall within an elongated ellipse, the major axis of which makes a 45°angle, approximately, with the x, y axes. Occasionally it happens that the axes are not the bisectors of the coordinate axes. This paper (1) examines more closely the assumptions underlying the Youden diagram and presents a more general method of interpreting it and (2) generalizes the diagram to situations where the two samples do not have the same level and/or the axes of the ellipse definitely do not bisect the coordinate axes.
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