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Interpretation and Generalization of Youden's Two-Sample Diagram

 

作者: MandelJohn,   LashofTheodore W.,  

 

期刊: Journal of Quality Technology  (Taylor Available online 1974)
卷期: Volume 6, issue 1  

页码: 22-36

 

ISSN:0022-4065

 

年代: 1974

 

DOI:10.1080/00224065.1974.11980612

 

出版商: Taylor&Francis

 

关键词: Youden's Two-Sample Diagram;Fitting an Ellipse;Random and Systematic Errors;Additivity;Non-Additivity;Interlaboratory Comparisons;Sphericity Test

 

数据来源: Taylor

 

摘要:

Youden's two sample diagram is a useful method for certain types of interlaboratory comparisons of test results. Generally, points in the plot fall within an elongated ellipse, the major axis of which makes a 45°angle, approximately, with the x, y axes. Occasionally it happens that the axes are not the bisectors of the coordinate axes. This paper (1) examines more closely the assumptions underlying the Youden diagram and presents a more general method of interpreting it and (2) generalizes the diagram to situations where the two samples do not have the same level and/or the axes of the ellipse definitely do not bisect the coordinate axes.

 

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