Observation of the tin whisker by micro‐Auger electron spectroscopy
作者:
Kenzo Fujiwara,
Ryusuke Kawanaka,
期刊:
Journal of Applied Physics
(AIP Available online 1980)
卷期:
Volume 51,
issue 12
页码: 6231-6232
ISSN:0021-8979
年代: 1980
DOI:10.1063/1.327607
出版商: AIP
数据来源: AIP
摘要:
An observation by micro‐Auger electron spectroscopy has been made of the tin whisker grown on electroplated tin films. Direct experimental evidence has been obtained for the existence of zinc and oxygen impurities on tin whiskers as well as on the electroplated film surfaces when a brass or zinc‐coated metal is used as a substrate. The localization of these impurities on these surfaces may be related to the growth mechanism of tin whiskers or to the driving force by lowering the surface energy.
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