Layer‐by‐layer removal of GaAs(110) by bromine
作者:
C. Y. Cha,
J. H. Weaver,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1996)
卷期:
Volume 14,
issue 6
页码: 3559-3562
ISSN:1071-1023
年代: 1996
DOI:10.1116/1.588797
出版商: American Vacuum Society
关键词: ZINC ADDITIONS;GALLIUM ARSENIDES;ETCHING;BROMINE;MORPHOLOGY;DESORPTION;TEMPERATURE DEPENDENCE;GaAs:Zn
数据来源: AIP
摘要:
Scanning tunneling microscopy results show that heating a nearly saturated Br–GaAs(110) 2×1/c(2×2) surface to 600 K leads to a random distribution of single‐layer deep vacancy islands. These islands expand via continued etching upon heating to 700 K. Subsequent exposure to Br2at 625 K results in complete removal of the first layer via step retreat. Accordingly, monolayer etching can be achieved. The different etching pathways of the exposure‐annealing treatment and that of continuous etching are discussed.
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