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Layer‐by‐layer removal of GaAs(110) by bromine

 

作者: C. Y. Cha,   J. H. Weaver,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1996)
卷期: Volume 14, issue 6  

页码: 3559-3562

 

ISSN:1071-1023

 

年代: 1996

 

DOI:10.1116/1.588797

 

出版商: American Vacuum Society

 

关键词: ZINC ADDITIONS;GALLIUM ARSENIDES;ETCHING;BROMINE;MORPHOLOGY;DESORPTION;TEMPERATURE DEPENDENCE;GaAs:Zn

 

数据来源: AIP

 

摘要:

Scanning tunneling microscopy results show that heating a nearly saturated Br–GaAs(110) 2×1/c(2×2) surface to 600 K leads to a random distribution of single‐layer deep vacancy islands. These islands expand via continued etching upon heating to 700 K. Subsequent exposure to Br2at 625 K results in complete removal of the first layer via step retreat. Accordingly, monolayer etching can be achieved. The different etching pathways of the exposure‐annealing treatment and that of continuous etching are discussed.

 

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