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Full and Partial Particle Replication Technique for Electron Microscopy

 

作者: F. Leonhard,   C. F. Cook,   F. R. Anderson,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1960)
卷期: Volume 31, issue 11  

页码: 1181-1185

 

ISSN:0034-6748

 

年代: 1960

 

DOI:10.1063/1.1716846

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The state of the art, and the principal problems of particle replication techniques have been reviewed. The objective was to obtain the highest reliability as well as the maximum geometrical and contrast resolution for the replication technique. To this end, further improvements and complementary developments of the now‐known techniques of particle replication were made. The essential stages consist of: (1) preshadowing of the sample by a refractory alloy (Pt:10%Rh) evaporated in high vacuum from a carbon rod; (2) utilizing a residual gas scattering evaporation technique (carbon in an argon atmosphere of 10−3mm Hg) at twice the mean free path of the carbon (this forms a thin uniform carbon coating layer as a supporting layer which gives a minimum of contrast in the electron microscope); (3) utilizing an auxiliary strengthening layer of a subliming material (sulfur) to protect effectively the replica from deformation or fracture during the preparation procedure (the auxiliary layer can later be removed by sublimation); (4) development of an easy to do partial‐particle replication technique, utilizing a thermoplastic embedding technique to restrict replication to only one side of a particle which will give superposition free images.

 

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