The effect of sample position on the determination of triaxial stress by X‐ray diffraction
作者:
R. H. Fenn,
A. M. Jones,
期刊:
Journal of Applied Crystallography
(WILEY Available online 1988)
卷期:
Volume 21,
issue 1
页码: 38-41
ISSN:1600-5767
年代: 1988
DOI:10.1107/S0021889887008860
出版商: International Union of Crystallography
数据来源: WILEY
摘要:
The determination of the full three‐dimensional stress tensor in a specimen by X‐ray diffraction requires that the strain be measured with the sample tilted in both a positive and a negative sense for different rotations of the sample in its own plane. The error introduced in the measured strain as a function of the position of the specimen relative to the X‐ray diffractometer axis is investigated and it is shown that the negative tilt values are more sensitive to sample position than the positive tilt values. The determination of the shear stress components uses the difference between the measured strain at equivalent positive and negative tilts and hence it is shown that displacement of the sample could lead to incorrect deductions concerning the presence and magnitude of the shear stress compo
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