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Hot electron emission lithography

 

作者: M. Poppeller,   E. Cartier,   R. M. Tromp,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 73, issue 19  

页码: 2835-2837

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.122606

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have developed an electron lithography method, hot electron emission lithography, which is capable of printing integrated circuits with an exposure time of only a few seconds. The basic design and fabrication of the patterned electron emitting mask made by standard metal–oxide–semiconductor technology will be discussed, and its applicability in a simple 1:1 e-beam stepper will be demonstrated. Patterns with a minimum feature size of 160 nm have been printed successfully. Further improvements in resolution to 50 nm appear to be possible. ©1998 American Institute of Physics. 

 

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