An apparatus for microsectioning diffusion samples by sputtering
作者:
J. N. Mundy,
S. J. Rothman,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1983)
卷期:
Volume 1,
issue 1
页码: 74-76
ISSN:0734-2101
年代: 1983
DOI:10.1116/1.572313
出版商: American Vacuum Society
关键词: sputtering;diffusion;milling;ion sources;nickel oxides;chromium;cutting
数据来源: AIP
摘要:
A new sputtering apparatus for taking thin sections from solid‐state diffusion samples is described. New features include the use of a Kaufman‐type ion gun, high‐yield chamber geometry, and a catcher‐foil advance mechanism capable of taking 32 sections without breaking vacuum. The apparatus can also be used as a general laboratory facility for ion milling.
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