首页   按字顺浏览 期刊浏览 卷期浏览 Direct observation of fullerene‐adsorbed tips by scanning tunneling microscopy
Direct observation of fullerene‐adsorbed tips by scanning tunneling microscopy

 

作者: K. F. Kelly,   Dipankar Sarkar,   Stefano Prato,   J. S. Resh,   G. D. Hale,   N. J. Halas,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1996）
卷期: Volume 14, issue 2  

页码: 593-596

 

ISSN:1071-1023

 

年代: 1996

 

DOI:10.1116/1.589141

 

出版商: American Vacuum Society

 

关键词: PROBES;GRAPHITE;FULLERENES;MOLECULES;PHYSICAL RADIATION EFFECTS;ARGON IONS;fullerenes;graphite

 

数据来源: AIP

 

摘要:

We have succeeded in imaging individual C60molecules that have been adsorbed onto the tunneling region of a scanning tunneling microscopy tip. The individual tip‐adsorbed molecules are imaged by scanning the fullerene‐adsorbed tip over a defect covered graphite surface. The defects are generated by low energy argon ion bombardment and protrude from the graphite surface. These nanometer‐size defects serve as a surface tip array which inverse images the molecules adsorbed to the tip when the surface is scanned.

 

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