MIL-STD-883 and Related Documents
作者:
KochendarferDavid C.,
PabstWilliam R.,
期刊:
Journal of Quality Technology
(Taylor Available online 1975)
卷期:
Volume 7,
issue sup1
页码: 137-146
ISSN:0022-4065
年代: 1975
DOI:10.1080/00224065.1975.12002465
出版商: Taylor&Francis
关键词: Microelectronics;Microcircuits;MIL-STD-883;MIL-M-38510;Quality Assurance;Lot Acceptance;Acceptance Sampling;MIL-STD-105D
数据来源: Taylor
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