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Pseudo moire´ dislocations appearing in x‐ray diffraction topography

 

作者: J. Yoshimura,  

 

期刊: Journal of Applied Physics  (AIP Available online 1996)
卷期: Volume 80, issue 4  

页码: 2138-2141

 

ISSN:0021-8979

 

年代: 1996

 

DOI:10.1063/1.363828

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In recent x‐ray moire´ topographic experiments a dislocationlike discontinuity of moire´ fringes has been found despite the fact that specimens (Si bicrystal) were dislocation free. This discontinuity, although similar in appearance to the fringe discontinuity known as moire´ dislocation, should be essentially distinguished from it. Preliminary considerations suggest that the outbreak of such pseudo‐moire´ dislocations is related not only to the wave‐field phase due to the moire´ effect, but to the phase of extinction fringes. Pseudo‐moire´ dislocations commonly occur in plane‐wave x‐ray moire´ topography of slightly strained specimens. ©1996 American Institute of Physics.

 

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