Noncontact scanning probe microscope potentiometry of surface charge patches: Origin and interpretation of time-dependent signals
作者:
Samia Cunningham,
Ivan A. Larkin,
John H. Davis,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 73,
issue 1
页码: 123-125
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.121788
出版商: AIP
数据来源: AIP
摘要:
We have modeled the generation of a voltage signal in noncontact potentiometric scanning force microscopy for a locally enhanced potential due to an isolated patch of electrostatic charge on an insulating surface. Both the distribution of the charge and the dielectric nature of the insulator is taken into account. When the charge is assumed to disperse ohmically on the surface, a complex time-dependent decay in the signal occurs. The profile of the decay predicted by this assumption has a shape similar to that observed experimentally in submicron scale contact charging experiments. ©1998 American Institute of Physics.
点击下载:
PDF
(78KB)
返 回