Stability of Te–Cu amorphous alloy thin films for optical recording
作者:
P. F. Carcia,
F. D. Kalk,
P. E. Bierstedt,
A. Ferretti,
G. A. Jones,
D. G. Swartzfager,
期刊:
Journal of Applied Physics
(AIP Available online 1988)
卷期:
Volume 64,
issue 4
页码: 1671-1678
ISSN:0021-8979
年代: 1988
DOI:10.1063/1.341787
出版商: AIP
数据来源: AIP
摘要:
We have studied the structure and optical stability of Te–Cu thin film alloy candidates for write‐once optical recording. Films prepared by rf diode sputtering with 20–50 at. % Cu are amorphous, as‐sputtered. One of these, Te65Cu35, has a relatively high crystallization temperature (150 °C), as determined by x‐ray diffraction. Near the eutectic composition (∼29 at .% Cu), alloy films have stable optical properties after accelerated aging at 60 °C and 85% relative humidity. The mechanism for film stability near the eutectic was studied by x‐ray photoelectron spectroscopy and depth profiling using ion scattering spectroscopy. We found that a Cu‐enriched surface oxide, formed at ambient conditions, passivates the film and is responsible for its subsequent stability after accelerated aging. We also demonstrated that a 14 in. diam, multilayer optical disk with a Te65Cu35recording medium exhibits excellent linearity for 3 and 8 MHz pulses, good written pulse length stability, and high signal‐to‐noise ratio. Thus, a Te–Cu recording medium can effectively use run‐length‐limited codes, which allow very high data storage capacity and data transfer rates.
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