Monovacancy formation energy in III–V compound semiconductors from positron annihilation measurements
作者:
A. Sen Gupta,
S.V. Naidu,
P. Sen,
期刊:
Radiation Effects
(Taylor Available online 1985)
卷期:
Volume 88,
issue 1-2
页码: 101-104
ISSN:0033-7579
年代: 1985
DOI:10.1080/00337578608207500
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
The Doppler broadening annihilation lineshape measurements have been performed in GaP and GaAs in the temperature ranges 132–675 K and 144–550 K respectively, in thermal equilibrium. The data show a pronounced vacancy trapping effect. From the knowledge of the threshold temperature,Tt, the vacancy formation energy has been predicted as 0.52 eV for GaP and 0.57 eV for GaAs.
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