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Detection of the metastable state of the EL2 defect in GaAs

 

作者: J. C. Bourgoin,   T. Neffati,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 82, issue 8  

页码: 4124-4125

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.365724

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Using a classical photocapacitance technique, we have transformed the well-known EL2 defects, related to the As antisite in GaAs, into their metastable states. Using the capacitance, we have monitored the temperature dependence of the electron occupancy of these metastable states at thermal equilibrium. From this study, we deduce that a level located at 40 meV below the conduction band is associated with electron ionization from the metastable EL2 states. ©1997 American Institute of Physics.

 

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