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Reply to ’’Comments on ’Normal modes of semiconductorp‐n‐junction devices for material‐parameter determination’ ’’

 

作者: Fredrik A. Lindholm,   C. T. Sah,  

 

期刊: Journal of Applied Physics  （AIP Available online 1981）
卷期: Volume 52, issue 11  

页码: 7007-7007

 

ISSN:0021-8979

 

年代: 1981

 

DOI:10.1063/1.328669

 

出版商: AIP

 

数据来源: AIP

 

摘要:

This reply provides a perspective on open‐circuit voltage decay (OCVD) different from R. Muralidharan and S. C. Jain by emphasizing the connection between their work and our previous publication, and by indicating in what respects their work falls short of a complete solution.

 

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