(1̄1̄1̄) CdTe surface structure: A study by reflection high energy electron diffraction, x‐ray photoelectron spectroscopy, and x‐ray photoelectron diffraction
作者:
R. Duszak,
S. Tatarenko,
J. Cibert,
K. Saminadayar,
C. Deshayes,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1991)
卷期:
Volume 9,
issue 6
页码: 3025-3030
ISSN:0734-2101
年代: 1991
DOI:10.1116/1.577167
出版商: American Vacuum Society
关键词: CADMIUM TELLURIDES;ELECTRON DIFFRACTION;PHOTOELECTRON SPECTROSCOPY;X RADIATION;SURFACE RECONSTRUCTION;ANNEALING;ETCHING;BINDING ENERGY;BINARY COMPOUNDS;CdTe
数据来源: AIP
摘要:
The (1̄1̄1̄) CdTe surface is studied by reflection high energy electron diffraction, x‐ray photoelectron spectroscopy, and x‐ray photoelectron diffraction (XRD). Several surface reconstructions are described. Shifts in the Cd (3d) binding energy levels allow separation of contribution of surface Cd atoms from that of the bulk. While bulk atoms exhibit XPD effects along the standard crystallographic directions, for surface atoms the diffraction effects occur along distinct directions which correspond to an outwards relaxation of the topmost Te layer. These findings are consistent with a recently proposed model of the CdTe (1̄1̄1̄) surface.
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