首页   按字顺浏览 期刊浏览 卷期浏览 Characterization of the ZnSe heteroepilayer on a GaAs/Si substrate
Characterization of the ZnSe heteroepilayer on a GaAs/Si substrate

 

作者: M. K. Lee,   M. Y. Yeh,   J. H. Chang,   K. Y. Yu,   Y. F. Lin,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 67, issue 8  

页码: 3898-3900

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.344996

 

出版商: AIP

 

数据来源: AIP

 

摘要:

ZnSe is a semiconductor with a direct band gap of 2.68 eV at room temperature, which makes it one of the most important materials for blue electroluminescent devices and short wavelength laser diodes. In this communication, heteroepitaxial growth of ZnSe on a GaAs/Si substrate by low‐pressure organometallic chemical vapor deposition is reported. The ZnSe/GaAs/Si epilayer exhibits a uniform surface morphology. Strong photoluminescence near‐band‐edge emission was observed. The thickness of the GaAs buffer layer seems to be an important factor in the energy shift of the photoluminescence peak.

 

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