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Development and Applications for the Remote Controllable Atomic Force Microscope

 

作者: P. Fornaro,   M. Guggisberg,   T. Gyalog,   Ch. Wattinger,   E. Meyer,   H.‐J. Gu¨ntherodt,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1903)
卷期: Volume 696, issue 1  

页码: 328-335

 

ISSN:0094-243X

 

年代: 1903

 

DOI:10.1063/1.1639714

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We present a fully remote controllable AFM, featuring a motorized four‐axis sample stage. The low cost robotics allows a fast and accurate change of pre‐defined positions. Due to the software interface the instrument can be programmed to perform sequences of measurements. This allows the automated acquisition of large scale high resolution images. The instrument can be controlled and monitored from various locations using a standard network interface. © 2003 American Institute of Physics

 

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