Development and Applications for the Remote Controllable Atomic Force Microscope
作者:
P. Fornaro,
M. Guggisberg,
T. Gyalog,
Ch. Wattinger,
E. Meyer,
H.‐J. Gu¨ntherodt,
期刊:
AIP Conference Proceedings
(AIP Available online 1903)
卷期:
Volume 696,
issue 1
页码: 328-335
ISSN:0094-243X
年代: 1903
DOI:10.1063/1.1639714
出版商: AIP
数据来源: AIP
摘要:
We present a fully remote controllable AFM, featuring a motorized four‐axis sample stage. The low cost robotics allows a fast and accurate change of pre‐defined positions. Due to the software interface the instrument can be programmed to perform sequences of measurements. This allows the automated acquisition of large scale high resolution images. The instrument can be controlled and monitored from various locations using a standard network interface. © 2003 American Institute of Physics
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