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The Application of Exponential Smoothing to Reliability Assessment

 

作者: AlanJ. Gross,  

 

期刊: Technometrics  (Taylor Available online 1971)
卷期: Volume 13, issue 4  

页码: 877-883

 

ISSN:0040-1706

 

年代: 1971

 

DOI:10.1080/00401706.1971.10488859

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Consider a complex subsystem such as a missile which undergoes testing in stages. That is, the subsystem is testednitimes withxirecorded successes at thei-th stage of testing. The reliability of thei-th stage is estimated asri=xi/ni. In this paper, exponential smoothing is used to assess the overall reliability of the subsystem at the end of each stage of testing. That is, fii, the overall reliability at thei-th stage of testing is related to the reliabilities at the earlier stages by the equation Ri= αiri+ (1 – αi)Ri–1where Ri–1is the overall reliability at the (i– 1)-th stage and αi∊ [0, l] is thei-th stage smoothing constant. Methodology (Bayesian and empirical) is developed to determine, objectively, estimates of the smoothing constants.

 

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