The Application of Exponential Smoothing to Reliability Assessment
作者:
AlanJ. Gross,
期刊:
Technometrics
(Taylor Available online 1971)
卷期:
Volume 13,
issue 4
页码: 877-883
ISSN:0040-1706
年代: 1971
DOI:10.1080/00401706.1971.10488859
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Consider a complex subsystem such as a missile which undergoes testing in stages. That is, the subsystem is testednitimes withxirecorded successes at thei-th stage of testing. The reliability of thei-th stage is estimated asri=xi/ni. In this paper, exponential smoothing is used to assess the overall reliability of the subsystem at the end of each stage of testing. That is, fii, the overall reliability at thei-th stage of testing is related to the reliabilities at the earlier stages by the equation Ri= αiri+ (1 – αi)Ri–1where Ri–1is the overall reliability at the (i– 1)-th stage and αi∊ [0, l] is thei-th stage smoothing constant. Methodology (Bayesian and empirical) is developed to determine, objectively, estimates of the smoothing constants.
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