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Electro‐optic sampling measurements of high‐speed InP integrated circuits

 

作者: J. M. Wiesenfeld,   R. S. Tucker,   A. Antreasyan,   C. A. Burrus,   A. J. Taylor,   V. D. Mattera,   P. A. Garbinski,  

 

期刊: Applied Physics Letters  （AIP Available online 1987）
卷期: Volume 50, issue 19  

页码: 1310-1312

 

ISSN:0003-6951

 

年代: 1987

 

DOI:10.1063/1.97891

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Multigigahertz waveforms in an InGaAs/InP metal‐insulator‐semiconductor field‐effect transistor inverter circuit have been measured noninvasively using the electro‐optic sampling technique with pulses from a gain‐switched InGaAsP laser. Propagation delays as low as 15 ps in a single inverter stage have been measured.

 

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