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Microfabrication of a mechanically controllable break junction in silicon

 

作者: C. Zhou,   C. J. Muller,   M. R. Deshpande,   J. W. Sleight,   M. A. Reed,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 8  

页码: 1160-1162

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.114994

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We present a detailed description of the fabrication and operation at room temperature of a novel type of tunnel displacement transducer. Instead of a feedback system it relies on a large reduction factor assuring an inherently stable device. Stability measurements in the tunnel regime infer an electrode stability within 3 pm in a 1 kHz bandwidth. In the contact regime the conductance takes on a discrete number of values when the constriction is reduced atom by atom. This reflects the conduction through discrete channels. ©1995 American Institute of Physics.

 

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