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Scanned Probes Old and New

 

作者: H. Kumar Wickramasinghe,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1991)
卷期: Volume 241, issue 1  

页码: 9-22

 

ISSN:0094-243X

 

年代: 1991

 

DOI:10.1063/1.41408

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The Scanning Tunneling Microscope (STM) has stimulated a range of new microscopies which essentially use the same scanning and feedback principles to obtain nanometer resolution images. In this contribution, we review the history of scanned probe techniques and discuss some of the new directions that have evolved with particular reference to work done in our own group.

 

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