Scanned Probes Old and New
作者:
H. Kumar Wickramasinghe,
期刊:
AIP Conference Proceedings
(AIP Available online 1991)
卷期:
Volume 241,
issue 1
页码: 9-22
ISSN:0094-243X
年代: 1991
DOI:10.1063/1.41408
出版商: AIP
数据来源: AIP
摘要:
The Scanning Tunneling Microscope (STM) has stimulated a range of new microscopies which essentially use the same scanning and feedback principles to obtain nanometer resolution images. In this contribution, we review the history of scanned probe techniques and discuss some of the new directions that have evolved with particular reference to work done in our own group.
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