Advantages of wavelength‐dispersive spectrometers over energy‐dispersive spectrometers for parallel detection of x rays are discussed and factors involved in the design of wavelength‐dispersive spectrometers are reviewed. The dispersion and collection solid angle of fixed‐position Bragg diffractors used for parallel detection of x rays are calculated and the properties of four such spectrometers based on singly and doubly curved diffractors are compared with the properties of scanning monochromators. It is concluded that the previously studied parallel‐detection spectrometers based on Bragg diffractors are less advantageous than scanning monochromators but they may be preferred when it is necessary to detect many characteristic x‐ray lines simultaneously or to avoid the use of moving parts.