The problem of surface‐wave reflection at thin‐strip overlays occurs frequently in signal‐processing devices. Grooved array reflectors employ strip overlays of the same material as the substrate, while metallic transducers incorporate strips of a material different from the substrate. A simple model for calculating the reflection coefficient of thin overlays is described, based on the normal‐mode analysis developed by Auld. Calculated values are in close agreement with reported experimental values for grooves inST‐Xquartz andY‐Zlithium niobate, and for aluminum onST‐Xquartz.