Electrothermal transients due to self heating in a siliconp-ndiode
作者:
W.J.Stepowicz,
W.Janke,
期刊:
IEE Proceedings I (Solid-State and Electron Devices)
(IET Available online 1980)
卷期:
Volume 127,
issue 1
页码: 25-28
年代: 1980
DOI:10.1049/ip-i-1.1980.0005
出版商: IEE
数据来源: IET
摘要:
The method of calculating the junction-temperature response and the nonisothermal transienti/vcharacteristics for a silicon forward-biasedp-ndiode is presented in this paper. The proposed method is based on the iterative calculation procedure, in which a diode is assumed to be subjected to a current or voltage waveform. This is in contrast with other methods, in which a temperature-indepenmdent power-input function, seldom met in practice, is assumed. As an example, calculations of the voltage across the diode and of the junction temperature for some given current inputsi(t) have been performed according to the presented method, and the results are discussed.
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