Microstructure and critical current density of zone melt textured YBa2Cu3O6+x
作者:
P. McGinn,
W. Chen,
N. Zhu,
M. Lanagan,
U. Balachandran,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 57,
issue 14
页码: 1455-1457
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.104125
出版商: AIP
数据来源: AIP
摘要:
Zone melting has been used to produce texture in extruded YBa2Cu3O6+xwires. Highly aligned microstructures are produced witha‐bplanes oriented along the axis of the wires. Microstructural observations show that changes in alignment orientation can occur, and can result in the inability to carry a transport current. Pulsed transportJcmeasurements on oriented samples indicate a zero field critical current density greater than 4×104A/cm2.
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