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Microstructure and critical current density of zone melt textured YBa2Cu3O6+x

 

作者: P. McGinn,   W. Chen,   N. Zhu,   M. Lanagan,   U. Balachandran,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 57, issue 14  

页码: 1455-1457

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.104125

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Zone melting has been used to produce texture in extruded YBa2Cu3O6+xwires. Highly aligned microstructures are produced witha‐bplanes oriented along the axis of the wires. Microstructural observations show that changes in alignment orientation can occur, and can result in the inability to carry a transport current. Pulsed transportJcmeasurements on oriented samples indicate a zero field critical current density greater than 4×104A/cm2.

 

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