Use of Electron Probes in the Study of Recombination Radiation
作者:
David B. Wittry,
David F. Kyser,
期刊:
Journal of Applied Physics
(AIP Available online 1964)
卷期:
Volume 35,
issue 8
页码: 2439-2442
ISSN:0021-8979
年代: 1964
DOI:10.1063/1.1702876
出版商: AIP
数据来源: AIP
摘要:
The electron probe microanalyzer has been used to study the local variations in recombination radiation from gallium arsenide. The intensity of recombination radiation from different specimens varies by several orders of magnitude. Local fluctuations are observed which are attributed to surface deformation and to non‐uniform distribution of impurities. Within experimental error, the wavelength distribution was indistinguishable from the wavelength distribution from GaAs diodes.
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