New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope
作者:
F. Mugele,
A. Rettenberger,
J. Boneberg,
P. Leiderer,
期刊:
Review of Scientific Instruments
(AIP Available online 1998)
卷期:
Volume 69,
issue 4
页码: 1765-1769
ISSN:0034-6748
年代: 1998
DOI:10.1063/1.1148839
出版商: AIP
数据来源: AIP
摘要:
We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements onWSe2under illumination at variable temperatures. ©1998 American Institute of Physics.
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