首页   按字顺浏览 期刊浏览 卷期浏览 New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope
New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

 

作者: F. Mugele,   A. Rettenberger,   J. Boneberg,   P. Leiderer,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1998)
卷期: Volume 69, issue 4  

页码: 1765-1769

 

ISSN:0034-6748

 

年代: 1998

 

DOI:10.1063/1.1148839

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements onWSe2under illumination at variable temperatures. ©1998 American Institute of Physics.

 

点击下载:  PDF (290KB)



返 回