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X‐Ray Topographic Study of Tensile Deformation in Nearly Perfect Copper Crystals

 

作者: F. W. Young,   F. A. Sherrill,  

 

期刊: Journal of Applied Physics  (AIP Available online 1971)
卷期: Volume 42, issue 1  

页码: 230-237

 

ISSN:0021-8979

 

年代: 1971

 

DOI:10.1063/1.1659573

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Copper crystals of a cross section 0.5×0.1 cm and of an initial dislocation densityN50–5000 cm/cm3were deformed in tension, and Borrmann x‐ray topographs were taken after successive stress increments. All dislocations were observed and Burgers vectors determined. Stereo pairs were made. The grown‐in dislocations were moved very little by the applied stresses. For crystals of lower initialNmost of the dislocation generation could be related to localized stresses in the grip regions, while in the crystals with higher initialNthe generation probably was related to grown‐in dislocations. Slip bands were formed; neither the source nor the generation mechanism of dislocations in these bands was determined. Screw dislocations were left by edge segments running across the crystal. These screw dislocations cross slipped frequently at stresses of a few grams/mm2, and this process tended to fill the volume of crystal between the bands with dislocations. By counting all new dislocations the shear strain was computed and ``stress‐strain'' curves were obtained.

 

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