A method is presented that utilizes the frequency modulation technique in ultra‐high vacuum to measure the tip‐sample force field in all three dimensions with atomic resolution. It is based on a systematic procedure to record frequency shift versus distance curves. After their conversion into the tip‐surface potential landscape the complete force field in all three dimensions can be calculated. Experimental results obtained in the non‐contact regime on NiO(001) with an iron‐coated silicon tip are presented to demonstrate that interatomic vertical and lateral forces can be determined and assigned to specific sites within the surface unit cell. © 2003 American Institute of Physics