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Precision Wavelength Measurements in Near Infrared

 

作者: J. E. Fredrickson,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1973）
卷期: Volume 44, issue 1  

页码: 52-55

 

ISSN:0034-6748

 

年代: 1973

 

DOI:10.1063/1.1685955

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Wave number markers are simultaneously traced on the strip chart recording of near infrared spectra by use of an auxiliary optical system employing a Fabry‐Perot etalon. The method is applicable to plane grating scanning spectrometers and is independent of spectrometer source, slit, and detector arrangement.

 

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