Photoinduced discharge characteristics of the photoreceptors consisting of a poly‐n‐vinylcarbazole (PVK) layer sensitized with a thin carrier‐generation layer have been analyzed theoretically. The electric field in the PVK layer has been calculated by solving the three basic equations: the law of hole conduction with neglect of diffusion, the continuity equation with no trap, and Poisson's equation. After long time from light‐on, the surface voltage is determined by the hole charges drifting in the PVK layer; it decreases with timetas(3/4)(tT0/t)1/3, wheretT0is the hole transit time across the PVK layer at the initial electric field. The theory has been compared with measurements on the photoreceptors in which the carrier‐generation layer consists of amorphous Se or amorphous Se0.86Te0.14. The hole mobility in the PVK layer has been estimated to be 10−5cm2/V sec at an electric field of 106V/cm. When illuminated with a tungsten light, the Se0.86Te0.14‐PVK photoreceptors have shown an emission‐limited discharge current which is nearly proportional to the surface voltage and is 4 times as large as that of the Se‐PVK photoreceptors at 106V/cm.