Refinement and validation of the PUTU wheat crop growth model 1. Phenology
作者:
SingelsA.,
de JagerJ.M.,
期刊:
South African Journal of Plant and Soil
(Taylor Available online 1991)
卷期:
Volume 8,
issue 2
页码: 59-66
ISSN:0257-1862
年代: 1991
DOI:10.1080/02571862.1991.10634581
出版商: Taylor&Francis Group
关键词: Growth model;phenological development;photoperiod;vernalization;wheat
数据来源: Taylor
摘要:
The phonological submodel of the PUTU wheat crop growth model was refined to account for the variation in sensitivity to vernalization and photoperiod. Crop development rate was simulated in five phenological phases making use of temperature and photoperiod. Base values of temperature, photoperiod and vernalization were determined for 22 cultivars currently grown in the RSA. After calibration the submodel was verified for two cultivars. It was shown on average to calculate accurately the date of flag leaf maturity and start of anthesis to within six and five days, respectively, of the true date. It was concluded that the phenological submodel of PUTU wheat crop growth model functioned satisfactorily.
点击下载:
PDF (501KB)
返 回