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X‐Ray Diffraction Line Shifts in the Debye‐Scherrer Pattern from Wire Specimens with Preferred Orientation

 

作者: Henry M. Otte,  

 

期刊: Journal of Applied Physics  (AIP Available online 1962)
卷期: Volume 33, issue 9  

页码: 2892-2893

 

ISSN:0021-8979

 

年代: 1962

 

DOI:10.1063/1.1702573

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In solid metal samples which have a strong texture, certain planes will favor the diffraction of the vertically divergent rays of the x‐ray beam more than the parallel rays. In extreme cases this will produce a diffraction peak shift. The direction and magnitude of the shift obtained from a specimen with a prominent ⟨001⟩ wire texture is in good agreement with the theoretical calculations of Pike (1957).

 

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