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A testability measure to improve algebraic test generation

 

作者: AntonioLioy,   MarcoMezzalama,  

 

期刊: Software & Microsystems  （IET Available online 1984）
卷期: Volume 3, issue 2  

页码: 37-41

 

年代: 1984

 

DOI:10.1049/sm.1984.0013

 

出版商: IEE

 

数据来源: IET

 

摘要:

The paper deals with testability measures of digital systems. Specifically, a new algorithm to evaluate testability measures for circuits described in terms of Boolean equations is presented, and its application to speed up (algebraic) test generation for sequential networks is discussed.

 

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